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      Calculation of thermal noise in atomic force microscopy

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      Nanotechnology
      IOP Publishing

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          Journal
          Nanotechnology
          Nanotechnology
          IOP Publishing
          0957-4484
          1361-6528
          January 01 1995
          January 01 1995
          : 6
          : 1
          : 1-7
          Article
          10.1088/0957-4484/6/1/001
          1ea3a5a3-8758-4928-93ae-29baed9e2c60
          © 1995
          History

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