Photo-induced forces can be used to manipulate and cool the mechanical motion of oscillators. When the oscillator is used as a force sensor, such as in atomic force microscopy, active feedback is an enticing route to enhancing measurement performance. Here, we show broadband multimode cooling of \(-23\) dB down to a temperature of \(8 \pm 1\)~K in the stationary regime. Through the use of periodic quiescence feedback cooling, we show improved signal-to-noise ratios for the measurement of transient signals. We compare the performance of real feedback to numerical post-processing of data and show that both methods produce similar improvements to the signal-to-noise ratio of force measurements. We achieved a room temperature force measurement sensitivity of \(< 2\times10^{-16}\) N with integration time of less than \(0.1\) ms. The high precision and fast force microscopy results presented will potentially benefit applications in biosensing, molecular metrology, subsurface imaging and accelerometry.