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      Titanium nitride oxidation chemistry: An x‐ray photoelectron spectroscopy study

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      Journal of Applied Physics
      AIP Publishing

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          Quantitative electron spectroscopy of surfaces: A standard data base for electron inelastic mean free paths in solids

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            Vacancy effects in the x-ray photoelectron spectra ofTiNx

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              The use of titanium-based contact barrier layers in silicon technology

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                Author and article information

                Journal
                Journal of Applied Physics
                Journal of Applied Physics
                AIP Publishing
                0021-8979
                1089-7550
                October 1992
                October 1992
                : 72
                : 7
                : 3072-3079
                Article
                10.1063/1.351465
                25cc80be-0e00-4b3c-a597-a5a34e69370c
                © 1992
                History

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