The study of disordered systems by EXAFS: Limitations

Brown, George S Jeb; Eisenberger, P

doi:10.1016/0038-1098(79)90790-7

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The study of disordered systems by EXAFS: Limitations

Author(s): P. Eisenberger , George S. Brown

Publication date Created: February 1979

Publication date (Print): February 1979

Journal: Solid State Communications

Publisher: Elsevier BV

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New Technique for Investigating Noncrystalline Structures: Fourier Analysis of the Extended X-Ray—Absorption Fine Structure

Dale Sayers, Edward A. Stern, Farrel W Lytle (1971)

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Extended x-ray-absorption fine-structure technique. III. Determination of physical parameters

D Sayers, F W Lytle, E Stern (1975)

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New method for the calculation of atomic phase shifts: Application to extended x-ray absorption fine structure (EXAFS) in molecules and crystals

G. Beni, P. A. Lee (1977)

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Journal

Title: Solid State Communications

Abbreviated Title: Solid State Communications

Publisher: Elsevier BV

ISSN (Print): 00381098

Publication date Created: February 1979

Publication date (Print): February 1979

Volume: 29

Issue: 6

Pages: 481-484

Article

DOI: 10.1016/0038-1098(79)90790-7

SO-VID: 3048c9f1-d45d-453a-a6ca-077039b2c039

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http://www.elsevier.com/tdm/userlicense/1.0/

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The study of disordered systems by EXAFS: Limitations

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Most cited references 7

New Technique for Investigating Noncrystalline Structures: Fourier Analysis of the Extended X-Ray—Absorption Fine Structure

Extended x-ray-absorption fine-structure technique. III. Determination of physical parameters

New method for the calculation of atomic phase shifts: Application to extended x-ray absorption fine structure (EXAFS) in molecules and crystals

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Article

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