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      Electrical properties of superfilled sub-micrometer silver metallizations

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          The mean free path of electrons in metals

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            Electrical-Resistivity Model for Polycrystalline Films: the Case of Arbitrary Reflection at External Surfaces

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              Damascene copper electroplating for chip interconnections

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                Author and article information

                Journal
                Journal of Applied Physics
                Journal of Applied Physics
                AIP Publishing
                0021-8979
                1089-7550
                July 2004
                July 2004
                : 96
                : 1
                : 759-768
                Article
                10.1063/1.1757655
                33ee4f2b-8704-4f7d-845b-272f9f0bf9f0
                © 2004
                History

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