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      On the Acceleration of Test Generation Algorithms

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      IEEE Transactions on Computers
      Institute of Electrical and Electronics Engineers (IEEE)

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          Most cited references6

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          Diagnosis of Automata Failures: A Calculus and a Method

          J. Roth (1966)
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            An Implicit Enumeration Algorithm to Generate Tests for Combinational Logic Circuits

            Goel (1981)
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              Controllability/observability analysis of digital circuits

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                Author and article information

                Journal
                IEEE Transactions on Computers
                IEEE Trans. Comput.
                Institute of Electrical and Electronics Engineers (IEEE)
                0018-9340
                December 1983
                December 1983
                : C-32
                : 12
                : 1137-1144
                Article
                10.1109/TC.1983.1676174
                385b8845-f440-4154-8600-4e1a7a5be22e
                © 1983
                History

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