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      Reliability of event-related potentials: the influence of number of trials and electrodes.

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          Abstract

          The reliability of event-related potentials (ERPs) is an important factor determining the value of studies relating ERP components to individual differences. However, studies examining the reliability of ERPs are surprisingly scarce. The current study examines the test-retest reliability of ERP components (VPP, N170, MFN, FRN, P3, and LPP) in response to feedback stimuli combining performance feedback with emotional faces in a sample of healthy female adults. In general, ERP amplitudes showed adequate to excellent test-retest reliability across a 4-week interval, depending on the component studied. Averaging ERP amplitudes across several electrodes yielded more reliable measurements than relying on a single electrode. Averaging across multiple trials substantially improved reliability. We recommend including at least 30 trials for early, spatio-temporally narrowly distributed components (such as VPP), but substantially more, at least 60 trials, for later, broadly distributed components such as the P3.

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          Author and article information

          Journal
          Physiol Behav
          Physiology & behavior
          Elsevier BV
          1873-507X
          0031-9384
          May 10 2014
          : 130
          Affiliations
          [1 ] Centre for Child and Family Studies, Leiden University, P.O. Box 9555, 2300 RB Leiden, The Netherlands; Leiden Institute for Brain and Cognition (LIBC), Leiden University, P.O. Box 9600, 2300 RC Leiden, The Netherlands. Electronic address: rhuffmeijer@fsw.leidenuniv.nl.
          [2 ] Centre for Child and Family Studies, Leiden University, P.O. Box 9555, 2300 RB Leiden, The Netherlands; Leiden Institute for Brain and Cognition (LIBC), Leiden University, P.O. Box 9600, 2300 RC Leiden, The Netherlands.
          Article
          S0031-9384(14)00142-5
          10.1016/j.physbeh.2014.03.008
          24642000
          428aeee8-d0c3-4187-81bc-e34344b321fe
          Copyright © 2014 Elsevier Inc. All rights reserved.
          History

          Emotional facial expressions,Event-related potentials,Feedback,Retest reliability

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