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Introduction
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Author(s):
Sorin Cristoloveanu
,
Sheng S. Li
Publication date
(Print):
1995
Publisher:
Springer US
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An Introduction to SAXS
Author and book information
Book Chapter
Publication date (Print):
1995
Pages
: 1-6
DOI:
10.1007/978-1-4615-2245-4_1
SO-VID:
4fb48d10-9f9a-4150-8c7b-ab6c49163370
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Book chapters
pp. 1
Introduction
pp. 7
Methods of Forming SOI Wafers
pp. 45
SOI Devices
pp. 87
Wafer-Screening Techniques
pp. 119
Transport Measurements
pp. 145
SIS Capacitor-Based Characterization Techniques
pp. 185
Diode Measurements
pp. 209
MOS Transistor Characteristics
pp. 275
Transistor-Based Characterization Techniques
pp. 337
Monitoring Transistor Degradation
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