Small sample size effects in statistical pattern recognition: recommendations for practitioners

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Journal

Title: IEEE Transactions on Pattern Analysis and Machine Intelligence

Abbreviated Title: IEEE Trans. Pattern Anal. Machine Intell.

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

ISSN (Print): 01628828

Publication date (Print): March 1991

Volume: 13

Issue: 3

Pages: 252-264

Article

DOI: 10.1109/34.75512

SO-VID: 64cdff5a-9160-4e89-be67-2997da52d317

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