For Publishers
DiscoveryMetadataPeer reviewHostingPublishing
For Researchers
JoinPublishReviewCollect
Register
Blog
About
Search
Advanced search
My ScienceOpen
Search
For Publishers
For Researchers
Blog
About
3
views
0
references
 Top references
cited by
1
    
0 reviews
 Review
0
comments
 Comment
0
recommends
+1 Recommend
0 collections
    0
    shares
      2,183
      similar
       All similar
      • Record: found
      • Abstract: not found
      • Conference Proceedings: not found

      Improving System Testability and Testing with Microarchitectures

      proceedings-article
      Author(s):
      Publication date (Print):
      Conference name: 2010 17th Working Conference on Reverse Engineering (WCRE)
      Conference date: November 13, 2010 - November 16, 2010

      Read this article at

      ScienceOpenPublisher
      Bookmark
          There is no author summary for this article yet. Authors can add summaries to their articles on ScienceOpen to make them more accessible to a non-specialist audience.

          Related collections

          Author and article information

          Conference
          Publication date: October 2010
          Publication date (Print): October 2010
          Pages: 309-312
          Article
          DOI: 10.1109/WCRE.2010.47
          SO-VID: 6758d649-75a4-403e-8384-b4d0f4523ba4
          Copyright © © 2010
          Conference name: 2010 17th Working Conference on Reverse Engineering (WCRE)
          Conference location: Beverly, MA, USA
          Conference date: November 13, 2010 - November 16, 2010
          History

          Data availability:

          Comments

          Comment on this article