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Atomic force microscopy for two-dimensional materials: A tutorial review
Author(s):
Hang Zhang
,
Junxiang Huang
,
Yongwei Wang
,
Rui Liu
,
Xiulan Huai
,
Jingjing Jiang
,
Chantelle Anfuso
Publication date
Created:
January 2018
Publication date
(Print):
January 2018
Journal:
Optics Communications
Publisher:
Elsevier BV
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Atomic Force Microscopy
Author and article information
Journal
Title:
Optics Communications
Abbreviated Title:
Optics Communications
Publisher:
Elsevier BV
ISSN (Print):
00304018
Publication date Created:
January 2018
Publication date (Print):
January 2018
Volume
: 406
Pages
: 3-17
Article
DOI:
10.1016/j.optcom.2017.05.015
SO-VID:
685e1458-f64f-4744-b4d9-369a1a60486b
Copyright ©
© 2018
License:
https://www.elsevier.com/tdm/userlicense/1.0/
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