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      Thermodynamics of Phase Transitions and Bipolar Filamentary Switching in Resistive Random-Access Memory

      , , ,
      Physical Review Applied
      American Physical Society (APS)

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            Reproducible switching effect in thin oxide films for memory applications

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              Noise in solid-state microstructures: A new perspective on individual defects, interface states and low-frequency (1/ƒ) noise

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                Author and article information

                Journal
                PRAHB2
                Physical Review Applied
                Phys. Rev. Applied
                American Physical Society (APS)
                2331-7019
                August 2017
                August 30 2017
                : 8
                : 2
                Article
                10.1103/PhysRevApplied.8.024028
                6fc05727-2420-4844-bd1f-1fdfb5ed64e5
                © 2017

                https://link.aps.org/licenses/aps-default-license

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