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      Positron study of defects in a-SixC1−xfilms produced by ion beam deposition method

      Author(s): , , , , , , ,
      Publication date Created:
      Publication date (Print):
      Journal: Applied Surface Science
      Publisher: Elsevier BV

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          Journal
          Title: Applied Surface Science
          Abbreviated Title: Applied Surface Science
          Publisher: Elsevier BV
          ISSN (Print): 01694332
          Publication date Created: June 2001
          Publication date (Print): June 2001
          Volume: 177
          Issue: 1-2
          Pages: 96-102
          Article
          DOI: 10.1016/S0169-4332(01)00201-X
          SO-VID: 7fb3108e-a3f6-46c3-a0e9-7ea47b3243f1
          Copyright © © 2001
          License:

          https://www.elsevier.com/tdm/userlicense/1.0/

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