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Characterization of the “native” surface thin film on pure polycrystalline iron: A high resolution XPS and TEM study
Author(s):
G. Bhargava
,
I. Gouzman
,
C.M. Chun
,
T.A. Ramanarayanan
,
S.L. Bernasek
Publication date
Created:
February 2007
Publication date
(Print):
February 2007
Journal:
Applied Surface Science
Publisher:
Elsevier BV
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HR-EBSD (High Resolution - Electron Back Scatter Diffraction)
Author and article information
Journal
Title:
Applied Surface Science
Abbreviated Title:
Applied Surface Science
Publisher:
Elsevier BV
ISSN (Print):
01694332
Publication date Created:
February 2007
Publication date (Print):
February 2007
Volume
: 253
Issue
: 9
Pages
: 4322-4329
Article
DOI:
10.1016/j.apsusc.2006.09.047
SO-VID:
847d7419-99c7-41b7-85e2-2d3bc3b79951
Copyright ©
© 2007
License:
http://www.elsevier.com/tdm/userlicense/1.0/
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