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      Characterization of the “native” surface thin film on pure polycrystalline iron: A high resolution XPS and TEM study

      , , , ,
      Applied Surface Science
      Elsevier BV

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          Journal
          Applied Surface Science
          Applied Surface Science
          Elsevier BV
          01694332
          February 2007
          February 2007
          : 253
          : 9
          : 4322-4329
          Article
          10.1016/j.apsusc.2006.09.047
          847d7419-99c7-41b7-85e2-2d3bc3b79951
          © 2007

          http://www.elsevier.com/tdm/userlicense/1.0/


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