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      Low dielectric constant materials for microelectronics

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      Journal of Applied Physics
      AIP Publishing

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          A variational approach to the theory of the elastic behaviour of multiphase materials

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            Measurement of Sheet Resistivities with the Four-Point Probe

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              Method for the calculation of effective pore size distribution in molecular sieve carbon.

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                Author and article information

                Journal
                Journal of Applied Physics
                Journal of Applied Physics
                AIP Publishing
                0021-8979
                1089-7550
                June 2003
                June 2003
                : 93
                : 11
                : 8793-8841
                Article
                10.1063/1.1567460
                8b8ef8a1-193b-4bcf-890e-4697cb130d01
                © 2003
                History

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