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      Compatibility of polycrystalline silicon gate deposition with HfO2 and Al2O3/HfO2 gate dielectrics

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          Dielectric functions and optical bandgaps of high-K dielectrics for metal-oxide-semiconductor field-effect transistors by far ultraviolet spectroscopic ellipsometry

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            Thermodynamic stability of high-K dielectric metal oxides ZrO2 and HfO2 in contact with Si and SiO2

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              Ultrathin high-K metal oxides on silicon: processing, characterization and integration issues

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                Author and article information

                Journal
                Applied Physics Letters
                Appl. Phys. Lett.
                AIP Publishing
                0003-6951
                1077-3118
                August 12 2002
                August 12 2002
                : 81
                : 7
                : 1288-1290
                Article
                10.1063/1.1499514
                a5663376-9e20-4879-8c9a-21b12ace354d
                © 2002
                History

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