For Publishers
DiscoveryMetadataPeer reviewHostingPublishing
For Researchers
JoinPublishReviewCollect
Register
Blog
About
Search
Advanced search
My ScienceOpen
Search
For Publishers
For Researchers
Blog
About
4
views
6
references
 Top references
cited by
39
    
0 reviews
 Review
0
comments
 Comment
0
recommends
+1 Recommend
0 collections
    0
    shares
      2,795
      similar
       All similar
      • Record: found
      • Abstract: not found
      • Article: not found

      Cosmic-Ray-Induced Errors in MOS Devices

      Read this article at

      ScienceOpenPublisher
      Bookmark
          There is no author summary for this article yet. Authors can add summaries to their articles on ScienceOpen to make them more accessible to a non-specialist audience.

          Related collections

          Most cited references6

          • Record: found
          • Abstract: not found
          • Article: not found

          Satellite Anomalies from Galactic Cosmic Rays

          E. Smith, D. Binder, A. Holman (1975)
          Article 0 comments Cited 64 times – based on 0 reviews     Review now
            Bookmark
            • Record: found
            • Abstract: not found
            • Article: not found

            Cosmic Ray Induced in MOS Memory Cells

            J. Blandford, J. C. Pickel (1978)
            Article 0 comments Cited 46 times – based on 0 reviews     Review now
              Bookmark
              • Record: found
              • Abstract: not found
              • Article: not found

              Simulation of Cosmic-Ray Induced Soft Errors and Latchup in Integrated-Circuit Computer Memories

              J. K. Anthony, W. A. Kolasinski, E. Smith … (1979)
              Article 0 comments Cited 41 times – based on 0 reviews     Review now
                Bookmark
                All references

                Author and article information

                Journal
                Title: IEEE Transactions on Nuclear Science
                Abbreviated Title: IEEE Trans. Nucl. Sci.
                Publisher: Institute of Electrical and Electronics Engineers (IEEE)
                ISSN (Print): 0018-9499
                Publication date Created: April 1980
                Publication date (Print): 1980
                Volume: 27
                Issue: 2
                Pages: 1006-1015
                Article
                DOI: 10.1109/TNS.1980.4330967
                SO-VID: b9ef08f0-1ea2-4695-99d8-06ab9755f04e
                Copyright © © 1980
                History

                Data availability:

                Comments

                Comment on this article

                scite_

                Similar content2,795

                See all similar

                Cited by39

                See all cited by

                Most referenced authors44

                See all reference authors