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Advanced Computing in Electron Microscopy
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Author(s):
Earl J. Kirkland
Publication date
(Print):
2010
Publisher:
Springer US
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oa repository (via OAI-PMH title and first author match)
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There is no author summary for this book yet. Authors can add summaries to their books on ScienceOpen to make them more accessible to a non-specialist audience.
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Atomic Force Microscopy
Author and book information
Book
ISBN (Print):
978-1-4419-6532-5
ISBN (Electronic):
978-1-4419-6533-2
Publication date (Print):
2010
DOI:
10.1007/978-1-4419-6533-2
SO-VID:
ce7d9435-ccec-49ae-9224-50db598fb2ae
License:
http://www.springer.com/tdm
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Book chapters
pp. 1
Introduction
pp. 5
The Transmission Electron Microscope
pp. 29
Linear Image Approximations
pp. 61
Sampling and the Fast Fourier Transform
pp. 77
Calculation of Images of Thin Specimens
pp. 115
Theory of Calculation of Images of Thick Specimens
pp. 163
Multislice Applications and Examples
pp. 199
The Programs
pp. 233
Plotting Transfer Functions
pp. 241
The Fourier Projection Theorem
pp. 243
Atomic Potentials and Scattering Factors
pp. 261
Bilinear Interpolation
pp. 265
3D Perspective View
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