Improved X-ray Spectrum Simulation for Electron Microprobe Analysis

Statham, Peter J.; Duncumb, Peter; Barkshire, Ian R.

doi:10.1017/S1431927601010339

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Improved X-ray Spectrum Simulation for Electron Microprobe Analysis

Author(s): Peter Duncumb , Ian R. Barkshire , Peter J. Statham

Publication date (Electronic): February 2 2002

Journal: Microscopy and Microanalysis

Publisher: Cambridge University Press (CUP)

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Journal ID (publisher-id): applab

Title: Microscopy and Microanalysis

Abbreviated Title: MAM

Publisher: Cambridge University Press (CUP)

ISSN (Print): 1431-9276

ISSN (Electronic): 1435-8115

Publication date Created: July 2001

Publication date (Electronic): February 2 2002

Publication date (Print): July 2001

Volume: 7

Issue: 04

Pages: 341-355

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DOI: 10.1017/S1431927601010339

SO-VID: ce8084ef-2042-429a-9750-da2a88ded147

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