ScienceOpen:
research and publishing network
For Publishers
Discovery
Metadata
Peer review
Hosting
Publishing
For Researchers
Join
Publish
Review
Collect
My ScienceOpen
Sign in
Register
Dashboard
Blog
About
Search
Advanced search
My ScienceOpen
Sign in
Register
Dashboard
Search
Search
Advanced search
For Publishers
Discovery
Metadata
Peer review
Hosting
Publishing
For Researchers
Join
Publish
Review
Collect
Blog
About
0
views
0
references
Top references
cited by
4
0 reviews
Review
0
comments
Comment
0
recommends
+1
Recommend
0
collections
Add to
0
shares
Share
Twitter
Sina Weibo
Facebook
Email
2,162
similar
All similar
Record
: found
Abstract
: not found
Article
: not found
Impedance mismatch effects on propagation constant measurements
Author(s):
D.C. DeGroot
,
D.K. WALKER
,
R.B. Marks
,
D.K. Walker
Publication date:
Journal:
Electrical Performance of Electronic Packaging
Read this article at
ScienceOpen
Publisher
Bookmark
There is no author summary for this article yet. Authors can add summaries to their articles on ScienceOpen to make them more accessible to a non-specialist audience.
Related collections
Italian Studies
Author and article information
Journal
DOI::
10.1109/EPEP.1996.564810
Data availability:
Comments
Comment on this article
Sign in to comment
scite_
Similar content
2,162
Bioelectrical impedance vector analysis (BIVA) in sport and exercise: Systematic review and future perspectives
Authors:
Jorge Castizo-Olier
,
Alfredo Irurtia
,
Monèm Jemni
…
Tonic GABAA conductance decreases membrane time constant and increases EPSP-spike precision in hippocampal pyramidal neurons
Authors:
Agnieszka Wlodarczyk
,
CHUN XU
,
Inseon Song
…
Long-range self-channeling of infrared laser pulses in air: a new propagation regime without ionization
Authors:
B Prade
,
R. Sauerbrey
,
A Mysyrowicz
…
See all similar
Cited by
4
Complex permittivity determination from propagation constant measurements
Authors:
J.A. Jargon
,
M.D. Janezic
Characterization of broad-band transmission for coplanar waveguides on CMOS silicon substrates
Authors:
D.C. DeGroot
,
J.A. Jargon
,
M. Gaitan
…
Permittivity characterization of low-k thin films from transmission-line measurements
Authors:
Chi Shih Chang
,
M.D. Janezic
,
A Karamcheti
…
See all cited by