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15
Use of Frustrated Total Internal Reflection to Measure Film Thickness and Surface Reliefs
Authors:
N J Harrick
Nanosampling internal reflection FT-IR study of polymer filaments
Authors:
Frank Deblase
,
N J Harrick
,
M. Milosevic
Internal Reflection Spectroscopy
Authors:
N J Harrick
,
NJ Harrick
,
N.J. Harrick
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N J Harrick
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