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Transport Measurements
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Most cited references16
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Mechanical and electrical properties of epitaxial silicon films on spinel
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Silicon‐on‐insulator material formed by oxygen implantation and high‐temperature annealing: Carrier transport, oxygen activity, and interface properties
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A pile‐up phenomenon during arsenic diffusion in silicon‐on‐insulator structures formed by oxygen implantation
N Guillemot, P Chenevier, D Tsoukalas … (1989)