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Breaking the diffraction resolution limit by stimulated emission: stimulated-emission-depletion fluorescence microscopy
Author(s):
Stefan Hell
,
Jan Wichmann
Publication date:
1994
Journal:
Optics letters
Publisher:
The Optical Society
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HR-EBSD (High Resolution - Electron Back Scatter Diffraction)
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DOI::
10.1364/OL.19.000780
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