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      SINIS process development for integrated circuits with characteristic voltages exceeding 250 μV

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          Journal
          Title: IEEE Transactions on Appiled Superconductivity
          Abbreviated Title: IEEE Trans. Appl. Supercond.
          Publisher: Institute of Electrical and Electronics Engineers (IEEE)
          ISSN (Print): 10518223
          Publication date (Print): March 2001
          Volume: 11
          Issue: 1
          Pages: 1070-1073
          Article
          DOI: 10.1109/77.919532
          SO-VID: 0fa6f80c-3594-4df0-ae76-729ac6d472e6
          Copyright © © 2001
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