Simulation of intrinsic parameter fluctuations in decananometer and nanometer-scale MOSFETs

Davies, J.H.; Kaya, S; Asenov, A.; Slavcheva, G.; Brown, A.R.

doi:10.1109/TED.2003.815862

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Simulation of intrinsic parameter fluctuations in decananometer and nanometer-scale MOSFETs

Author(s): A. Asenov , A.R. Brown , J.H. Davies , S. Kaya , G. Slavcheva

Publication date Created: September 2003

Publication date (Print): September 2003

Journal: IEEE Transactions on Electron Devices

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

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Most cited references 79

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Electronic properties of two-dimensional systems

Tsuneya Ando, Alan Fowler, Frank Stern (1982)

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Polarizability of a Two-Dimensional Electron Gas

Frank Stern (1967)

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Noise in solid-state microstructures: A new perspective on individual defects, interface states and low-frequency (1/ƒ) noise

M.J. Uren, M.J. Kirton (1989)

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Title: IEEE Transactions on Electron Devices

Abbreviated Title: IEEE Trans. Electron Devices

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

ISSN (Print): 0018-9383

Publication date Created: September 2003

Publication date (Print): September 2003

Volume: 50

Issue: 9

Pages: 1837-1852

Article

DOI: 10.1109/TED.2003.815862

SO-VID: 10d535b5-a7a0-4f97-b0f6-8439045ab705

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Simulation of intrinsic parameter fluctuations in decananometer and nanometer-scale MOSFETs

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Most cited references 79

Electronic properties of two-dimensional systems

Polarizability of a Two-Dimensional Electron Gas

Noise in solid-state microstructures: A new perspective on individual defects, interface states and low-frequency (1/ƒ) noise

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