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      Deformable Convolutional Networks for Multimodal Human Activity Recognition Using Wearable Sensors

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          Deep Residual Learning for Image Recognition

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            Going deeper with convolutions

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              Very Deep Convolutional Networks for Large-Scale Image Recognition

              In this work we investigate the effect of the convolutional network depth on its accuracy in the large-scale image recognition setting. Our main contribution is a thorough evaluation of networks of increasing depth using an architecture with very small (3x3) convolution filters, which shows that a significant improvement on the prior-art configurations can be achieved by pushing the depth to 16-19 weight layers. These findings were the basis of our ImageNet Challenge 2014 submission, where our team secured the first and the second places in the localisation and classification tracks respectively. We also show that our representations generalise well to other datasets, where they achieve state-of-the-art results. We have made our two best-performing ConvNet models publicly available to facilitate further research on the use of deep visual representations in computer vision.
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                Author and article information

                Contributors
                Journal
                IEEE Transactions on Instrumentation and Measurement
                IEEE Trans. Instrum. Meas.
                Institute of Electrical and Electronics Engineers (IEEE)
                0018-9456
                1557-9662
                2022
                2022
                : 71
                : 1-14
                Affiliations
                [1 ]School of Electrical and Automation Engineering, Nanjing Normal University, Nanjing, China
                [2 ]School of Information Science and Engineering, Yunnan University, Kunming, China
                [3 ]School of Instrument Science and Engineering, Southeast University, Nanjing, China
                Article
                10.1109/TIM.2022.3158427
                199608ce-e9cb-49ce-b56e-b2c652250b9b
                © 2022

                https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html

                https://doi.org/10.15223/policy-029

                https://doi.org/10.15223/policy-037

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