Dynamic model for piezotronic and piezo-phototronic devices under low and high frequency external compressive stresses

Due to polarization of ions in crystals with noncentral symmetry, such as ZnO, GaN, and InN, a piezoelectric potential (piezopotential) is created in the crystal when stress is applied. Electronics fabricated using the inner-crystal piezopotential as a gate voltage to tune or control the charge transport behavior across a metal/semiconductor interface or a p-n junction are called piezotronics. This is different from the basic design of complimentary metal oxide semiconductor (CMOS) field-effect transistors and has applications in force and pressure triggered or controlled electronic devices, sensors, microelectromechanical systems (MEMS), human-computer interfacing, nanorobotics, and touch-pad technologies. Here, the theory of charge transport in piezotronic devices is investigated. In addition to presenting the formal theoretical frame work, analytical solutions are presented for cases including metal-semiconductor contact and p-n junctions under simplified conditions. Numerical calculations are given for predicting the current-voltage characteristics of a general piezotronic transistor: metal-ZnO nanowire-metal device. This study provides important insight into the working principles and characteristics of piezotronic devices, as well as providing guidance for device design. Copyright © 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.