3
views
0
recommends
+1 Recommend
0 collections
    0
    shares
      • Record: found
      • Abstract: not found
      • Article: not found

      Raman Measurement of Lattice Temperature during Pulsed Laser Heating of Silicon

      ,
      Physical Review Letters
      American Physical Society (APS)

      Read this article at

      ScienceOpenPublisher
      Bookmark
          There is no author summary for this article yet. Authors can add summaries to their articles on ScienceOpen to make them more accessible to a non-specialist audience.

          Related collections

          Most cited references20

          • Record: found
          • Abstract: not found
          • Article: not found

          Intrinsic Optical Absorption in Single-Crystal Germanium and Silicon at 77°K and 300°K

            Bookmark
            • Record: found
            • Abstract: not found
            • Article: not found

            Theory of the First-Order Raman Effect in Crystals

            R. Loudon (1963)
              Bookmark
              • Record: found
              • Abstract: not found
              • Article: not found

              Time‐resolved reflectivity of ion‐implanted silicon during laser annealing

                Bookmark

                Author and article information

                Journal
                PRLTAO
                Physical Review Letters
                Phys. Rev. Lett.
                American Physical Society (APS)
                0031-9007
                June 1980
                June 16 1980
                : 44
                : 24
                : 1604-1607
                Article
                10.1103/PhysRevLett.44.1604
                22206c07-6212-40a4-a3cd-e28f1bec24bf
                © 1980

                http://link.aps.org/licenses/aps-default-license

                History

                Comments

                Comment on this article