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      Time‐resolved reflectivity of ion‐implanted silicon during laser annealing

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      Applied Physics Letters
      AIP Publishing

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          Spatially controlled crystal regrowth of ion‐implanted silicon by laser irradiation

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            Thermal Conductivity, Electrical Resistivity, and Seebeck Coefficient of Silicon from 100 to 1300°K

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              Dose dependence in the laser annealing of arsenic‐implanted silicon

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                Author and article information

                Journal
                Applied Physics Letters
                Appl. Phys. Lett.
                AIP Publishing
                0003-6951
                1077-3118
                September 1978
                September 1978
                : 33
                : 5
                : 437-440
                Article
                10.1063/1.90369
                323bfb7d-1ba3-4b18-9c36-a8359f7ece2c
                © 1978
                History

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