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      Influence of Scanning Strategy Parameters on Residual Stress in the SLM Process According to the Bridge Curvature Method for AISI 316L Stainless Steel

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          Abstract

          The present paper deals with the investigation and comparison of the influence of scanning strategy on residual stress in the selective laser melting (SLM) process. For the purpose of the experiment, bridge geometry samples were printed by a 3D metal printer, which exhibited tension after cutting from the substrate, slightly bending the samples toward the laser melting direction. Samples were produced with the variation of process parameters and with a change in scanning strategy which plays a major role in stress generation. It was evaluated using the Bridge Curvature Method (BCM) and optical microscopy. At the end, a recommendation was made.

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          Most cited references21

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          Assessing and comparing influencing factors of residual stresses in selective laser melting using a novel analysis method

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            An Experimental Investigation into Additive Manufacturing-Induced Residual Stresses in 316L Stainless Steel

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              Cross-Sectional Mapping of Residual Stresses by Measuring the Surface Contour After a Cut

              M. Prime (2001)
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                Author and article information

                Journal
                Materials (Basel)
                Materials (Basel)
                materials
                Materials
                MDPI
                1996-1944
                03 April 2020
                April 2020
                : 13
                : 7
                : 1659
                Affiliations
                [1 ]Department of Machining, Faculty of Mechanical Engineering, Technical University of Ostrava, Ostrava 708 00, Czech Republic; marek.pagac@ 123456vsb.cz (M.P.); jakub.mesicek@ 123456vsb.cz (J.M.); jana.petru@ 123456vsb.cz (J.P.)
                [2 ]Department of Engineering Materials and Biomaterials, Faculty of Mechanical Engineering, Silesian University of Technology, Gliwice 44-100, Poland; mariusz.krol@ 123456polsl.pl
                Author notes
                [* ]Correspondence: jiri.hajnys@ 123456vsb.cz ; Tel.: +420-597-329-064
                Author information
                https://orcid.org/0000-0002-7839-2767
                https://orcid.org/0000-0002-0438-721X
                https://orcid.org/0000-0002-2378-5678
                https://orcid.org/0000-0002-6703-5019
                Article
                materials-13-01659
                10.3390/ma13071659
                7178378
                32260108
                23d2f1df-6aba-4ef5-820e-bb41d05247fb
                © 2020 by the authors.

                Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license ( http://creativecommons.org/licenses/by/4.0/).

                History
                : 07 March 2020
                : 01 April 2020
                Categories
                Article

                scanning strategy,residual stress,slm,aisi316l,bcm
                scanning strategy, residual stress, slm, aisi316l, bcm

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