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      WSXM: A software for scanning probe microscopy and a tool for nanotechnology

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      Review of Scientific Instruments
      AIP Publishing

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          Abstract

          In this work we briefly describe the most relevant features of WSXM, a freeware scanning probe microscopy software based on MS-Windows. The article is structured in three different sections: The introduction is a perspective on the importance of software on scanning probe microscopy. The second section is devoted to describe the general structure of the application; in this section the capabilities of WSXM to read third party files are stressed. Finally, a detailed discussion of some relevant procedures of the software is carried out.

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          Author and article information

          Journal
          Review of Scientific Instruments
          Review of Scientific Instruments
          AIP Publishing
          0034-6748
          1089-7623
          January 2007
          January 2007
          : 78
          : 1
          : 013705
          Article
          10.1063/1.2432410
          17503926
          2cacd809-7b61-4bd1-bada-c66ab76814ce
          © 2007
          History

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