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      Exploiting micro-scale structural and chemical observations in real time for understanding chemical conversion: LEEM/PEEM studies over CeOx-Cu(111).

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          Abstract

          Proper consideration of length-scales is critical for elucidating active sites/phases in heterogeneous catalysis, revealing chemical function of surfaces and identifying fundamental steps of chemical reactions. Using the example of ceria thin films deposited on the Cu(111) surface, we demonstrate the benefits of multi length-scale experimental framework for understanding chemical conversion. Specifically, exploiting the tunable sampling and spatial resolution of photoemission electron microscopy, we reveal crystal defect mediated structures of inhomogeneous copper-ceria mixed phase that grow during preparation of ceria/Cu(111) model systems. The density of the microsized structures is such that they are relevant to the chemistry, but unlikely to be found during investigation at the nanoscale or with atomic level investigations. Our findings highlight the importance of accessing micro-scale when considering chemical pathways over heteroepitaxially grown model systems.

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          Author and article information

          Journal
          Ultramicroscopy
          Ultramicroscopy
          Elsevier BV
          1879-2723
          0304-3991
          May 10 2017
          Affiliations
          [1 ] Charles University, Faculty of Mathematics and Physics, Department of Surface and Plasma Science, V Holešovičkách 2, 18000 Prague 8, Czech Republic.
          [2 ] Peter Grünberg Institute (PGI-6), Forschungszentrum Jülich, 52425 Jülich, Germany.
          [3 ] Institute of Solid State Physics, University of Bremen, Otto-Hahn-Allee 1, 28359 Bremen, Germany.
          [4 ] Institute of Solid State Physics, University of Bremen, Otto-Hahn-Allee 1, 28359 Bremen, Germany; MAPEX Center for Materials and Processes, University of Bremen, 28359 Bremen, Germany.
          [5 ] Chemistry Department, Brookhaven National Laboratory, Upton, NY 11973, United States. Electronic address: ssenanay@bnl.gov.
          Article
          S0304-3991(17)30040-2
          10.1016/j.ultramic.2017.05.003
          28522241
          3225ff98-30e4-4c97-ab54-ba58b808b577
          History

          Ceria,Defects,Length-scale,Model systems,Photoemission electron microscopy

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