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      Geometry optimization of TMR current sensors for on-chip IC testing

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          Magnetoresistive random access memory using magnetic tunnel junctions

          G. Grynkewich, J.M. Slaughter, M. DeHerrera … (2003)
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            Iddq testing for CMOS VLSI

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              Spectrum-based BIST in complex SOCs

              G. Kasturirangan, M.S. Hsiao (2024)
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                Author and article information

                Journal
                Title: IEEE Transactions on Magnetics
                Abbreviated Title: IEEE Trans. Magn.
                Publisher: Institute of Electrical and Electronics Engineers (IEEE)
                ISSN (Print): 0018-9464
                Publication date Created: October 2005
                Publication date (Print): October 2005
                Volume: 41
                Issue: 10
                Pages: 3685-3687
                Article
                DOI: 10.1109/TMAG.2005.854813
                SO-VID: 32c0e498-d039-447f-a28b-7dbc83d85023
                Copyright © © 2005
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