For Publishers
DiscoveryMetadataPeer reviewHostingPublishing
For Researchers
JoinPublishReviewCollect
Register
Blog
About
Search
Advanced search
My ScienceOpen
Search
For Publishers
For Researchers
Blog
About
3
views
90
references
 Top references
cited by
4
    
0 reviews
 Review
0
comments
 Comment
0
recommends
+1 Recommend
0 collections
    0
    shares
      2,405
      similar
       All similar
      • Record: found
      • Abstract: not found
      • Article: not found

      Iddq testing for CMOS VLSI

      Author(s):
      Publication date (Print):
      Journal: Proceedings of the IEEE
      Publisher: Institute of Electrical and Electronics Engineers (IEEE)

      Read this article at

      ScienceOpenPublisher
      Bookmark
          There is no author summary for this article yet. Authors can add summaries to their articles on ScienceOpen to make them more accessible to a non-specialist audience.

          Related collections

          Most cited references90

          • Record: found
          • Abstract: not found
          • Article: not found

          Fault Modeling and Logic Simulation of CMOS and MOS Integrated Circuits

          R. L. Wadsack (1978)
          Article 0 comments Cited 48 times – based on 0 reviews     Review now
            Bookmark
            • Record: found
            • Abstract: not found
            • Article: not found

            Physical Versus Logical Fault Models MOS LSI Circuits: Impact on Their Testability

            Galiay, Crouzet, Vergniault (1980)
            Article 0 comments Cited 33 times – based on 0 reviews     Review now
              Bookmark
              • Record: found
              • Abstract: not found
              • Article: not found

              On physical models for gate oxide breakdown

              S Holland, I.C. Chen, T.P. Ma … (1984)
              Article 0 comments Cited 27 times – based on 0 reviews     Review now
                Bookmark
                All references

                Author and article information

                Journal
                Title: Proceedings of the IEEE
                Abbreviated Title: Proc. IEEE
                Publisher: Institute of Electrical and Electronics Engineers (IEEE)
                ISSN (Print): 0018-9219
                ISSN (Electronic): 1558-2256
                Publication date Created: April 2000
                Publication date (Print): April 2000
                Volume: 88
                Issue: 4
                Pages: 544-568
                Article
                DOI: 10.1109/5.843000
                SO-VID: cc8a3598-7254-49dd-ae0d-ed555c40f114
                Copyright © © 2000
                History

                Data availability:

                Comments

                Comment on this article