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Low field TDDB of BEOL interconnects using > 40 months of data
Author(s):
K. Croes
,
Ph. Roussel
,
Y. Barbarin
,
C Wu
,
Y. Li
,
J Bömmels
,
Zs. Tokei
,
Y Li
Publication date:
2013
Journal:
2013 IEEE International Reliability Physics Symposium (IRPS)
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Genome Engineering using CRISPR
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DOI::
10.1109/IRPS.2013.6531969
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