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      Assessment of engineered surfaces roughness by high-resolution 3D SEM photogrammetry.

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          Abstract

          We describe a methodology to obtain three-dimensional models of engineered surfaces using scanning electron microscopy and multi-view photogrammetry (3DSEM). For the reconstruction of the 3D models of the surfaces we used freeware available in the cloud. The method was applied to study the surface roughness of metallic samples patterned with parallel grooves by means of laser. The results are compared with measurements obtained using stylus profilometry (PR) and SEM stereo-photogrammetry (SP). The application of 3DSEM is more time demanding than PR or SP, but it provides a more accurate representation of the surfaces. The results obtained with the three techniques are compared by investigating the influence of sampling step on roughness parameters.

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          Author and article information

          Journal
          Ultramicroscopy
          Ultramicroscopy
          Elsevier BV
          1879-2723
          0304-3991
          Jun 2017
          : 177
          Affiliations
          [1 ] Departamento de Ciencia de los Materiales e Ingeniería Metalúrgica y Química Inorgánica, Universidad de Cádiz, Puerto Real 11510, Spain. Electronic address: lionelcg@gmail.com.
          [2 ] Departamento de Ciencia de los Materiales e Ingeniería Metalúrgica y Química Inorgánica, Escuela Superior de Ingeniería, Laboratorio de Corrosión, Universidad de Cádiz, Puerto Real 11519, Spain.
          [3 ] Departamento de Ingeniería Mecánica y Diseño Industrial, Escuela Superior de Ingeniería, Universidad de Cádiz, Puerto Real 11519, Spain.
          [4 ] Servicio de Microscopía Centro de Investigación, Tecnología e Innovación (CITIUS), Universidad de Sevilla, Av. Reina Mercedes 4b, 41012 Sevilla, Spain.
          [5 ] Departamento de Ciencia de los Materiales e Ingeniería Metalúrgica y Química Inorgánica, Universidad de Cádiz, Puerto Real 11510, Spain.
          Article
          S0304-3991(17)30001-3
          10.1016/j.ultramic.2017.03.007
          28340394
          41ae6dbc-3552-4717-a9b9-3785d6ec9642
          History

          3DSEM,Patterned surfaces,Photogrammetry,Profilometry,Roughness,SEM metrology,Stereo-photogrammetry

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