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      Recombination mechanisms and doping density in silicon

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      Journal of Applied Physics
      AIP Publishing

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          Carrier mobilities in silicon empirically related to doping and field

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            Auger coefficients for highly doped and highly excited silicon

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              Auger Effect in Semiconductors

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                Author and article information

                Journal
                Journal of Applied Physics
                Journal of Applied Physics
                AIP Publishing
                0021-8979
                1089-7550
                July 1983
                July 1983
                : 54
                : 7
                : 3935-3937
                Article
                10.1063/1.332568
                47008a63-ed7c-46ba-a716-7f44f3edcaff
                © 1983
                History

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