X-ray diffraction tomography with limited projection information

Abstract

X-ray diffraction tomography (XDT) records the spatially-resolved X-ray diffraction profile of an extended object. Compared to conventional transmission-based tomography, XDT displays high intrinsic contrast among materials of similar electron density and improves the accuracy in material identification thanks to the molecular structural information carried by diffracted photons. However, due to the weak diffraction signal, a tomographic scan covering the entire object typically requires a synchrotron facility to make the acquisition time more manageable. Imaging applications in medical and industrial settings usually do not require the examination of the entire object. Therefore, a diffraction tomography modality covering only the region of interest (ROI) and subsequent image reconstruction techniques with truncated projections are highly desirable. Here we propose a table-top diffraction tomography system that can resolve the spatially-variant diffraction form factor from internal regions within extended samples. We demonstrate that the interior reconstruction maintains the material contrast while reducing the imaging time by 6 folds. The presented method could accelerate the acquisition of XDT and be applied in portable imaging applications with a reduced radiation dose.