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      • Record: found
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      Thermal Conductivity, Electrical Resistivity, and Seebeck Coefficient of Silicon from 100 to 1300°K

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          Journal
          Journal ID (publisher-id): PHRVAO
          Title: Physical Review
          Abbreviated Title: Phys. Rev.
          Publisher: American Physical Society (APS)
          ISSN (Print): 0031-899X
          Publication date Created: March 1968
          Publication date (Print): March 1968
          Volume: 167
          Issue: 3
          Pages: 765-782
          Article
          DOI: 10.1103/PhysRev.167.765
          SO-VID: 48c0ed87-5f6d-46b1-a1bf-846cfb4dc9b1
          Copyright © © 1968
          License:

          http://link.aps.org/licenses/aps-default-license

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