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      Anodization rate and augmentation factor of anodic aluminum oxide films

      Journal of Applied Physics
      AIP Publishing

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          Generalized Formula for the Electric Tunnel Effect between Similar Electrodes Separated by a Thin Insulating Film

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            On the Preparation of Hard Oxide Films with Precisely Controlled Thickness on Evaporated Aluminum Mirrors*

            Georg Hass (1949)
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              The Thickness Measurement of Thin Films by Multiple Beam Interferometry

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                Author and article information

                Journal
                Journal of Applied Physics
                Journal of Applied Physics
                AIP Publishing
                0021-8979
                1089-7550
                April 1979
                April 1979
                : 50
                : 4
                : 2906-2909
                Article
                10.1063/1.326209
                4ee52977-c8c9-41d3-92fd-4ece4ee10870
                © 1979
                History

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