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      Scanning Probe Microscopy

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          Surface Studies by Scanning Tunneling Microscopy

          G. Binnig, H Rohrer, Andreas Gerber … (1982)
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            7 × 7 Reconstruction on Si(111) Resolved in Real Space

            G. Binnig, H Rohrer, Ch. Gerber … (1983)
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              Tunneling through a controllable vacuum gap

              G. Binnig, H Rohrer, Ch. Gerber … (1982)
              Article 0 comments Cited 257 times – based on 0 reviews     Review now
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                Author and article information

                Journal
                Title: IEEE Control Systems Magazine
                Abbreviated Title: IEEE Control Syst. Mag.
                Publisher: Institute of Electrical and Electronics Engineers (IEEE)
                ISSN (Print): 0272-1708
                Publication date Created: April 2008
                Publication date (Print): April 2008
                Volume: 28
                Issue: 2
                Pages: 65-83
                Article
                DOI: 10.1109/MCS.2007.914688
                SO-VID: 54d81c51-b985-4a82-9227-1a4b7d2bc093
                Copyright © © 2008
                History

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