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      Structural transformations of Ge2Sb2Te5 films studied by electrical resistance measurements

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      Journal of Applied Physics
      AIP Publishing

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          Reaction Kinetics in Differential Thermal Analysis

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            Rapid‐phase transitions of GeTe‐Sb2Te3pseudobinary amorphous thin films for an optical disk memory

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              Compound materials for reversible, phase‐change optical data storage

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                Author and article information

                Journal
                Journal of Applied Physics
                Journal of Applied Physics
                AIP Publishing
                0021-8979
                1089-7550
                May 2000
                May 2000
                : 87
                : 9
                : 4130-4134
                Article
                10.1063/1.373041
                5b5eb5cb-ff9f-4f20-8b2d-4c3cb2db337d
                © 2000
                History

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