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Nutraceutical properties of the methanolic extract of edible mushroom Cantharellus cibarius (Fries): primary mechanisms.
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      Physical Versus Logical Fault Models MOS LSI Circuits: Impact on Their Testability

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          Fault Modeling and Logic Simulation of CMOS and MOS Integrated Circuits

          R. L. Wadsack (1978)
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            Programmed Algorithms to Compute Tests to Detect and Distinguish Between Failures in Logic Circuits

            J. Roth, Peter Schneider, Willard G. Bouricius (1967)
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              Author and article information

              Journal
              Title: IEEE Transactions on Computers
              Abbreviated Title: IEEE Trans. Comput.
              Publisher: Institute of Electrical and Electronics Engineers (IEEE)
              ISSN (Print): 0018-9340
              Publication date Created: June 1980
              Publication date (Print): June 1980
              Volume: C-29
              Issue: 6
              Pages: 527-531
              Article
              DOI: 10.1109/TC.1980.1675614
              SO-VID: 6036076e-8e48-4581-9db1-eb87c4e6c48d
              Copyright © © 1980
              History

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