4
views
0
recommends
+1 Recommend
0 collections
    0
    shares
      • Record: found
      • Abstract: found
      • Article: found
      Is Open Access

      Enhanced ablation efficiency for silicon by femtosecond laser microprocessing with GHz bursts in MHz bursts(BiBurst)

      , ,
      International Journal of Extreme Manufacturing
      IOP Publishing

      Read this article at

      Bookmark
          There is no author summary for this article yet. Authors can add summaries to their articles on ScienceOpen to make them more accessible to a non-specialist audience.

          Abstract

          Ultrashort laser pulses confine material processing to the laser-irradiated area by suppressing heat diffusion, resulting in precise ablation in diverse materials. However, challenges occur when high speed material removal and higher ablation efficiencies are required. Ultrafast burst mode laser ablation has been proposed as a successful method to overcome these limitations. Following this approach, we studied the influence of combining GHz bursts in MHz bursts, known as BiBurst mode, on ablation efficiency of silicon. BiBurst mode used in this study consists of multiple bursts happening at a repetition rate of 64 MHz, each of which contains multiple pulses with a repetition rate of 5 GHz. The obtained results show differences between BiBurst mode and conventional single pulse mode laser ablation, with a remarkable increase in ablation efficiency for the BiBurst mode, which under optimal conditions can ablate a volume 4.5 times larger than the single pulse mode ablation while delivering the same total energy in the process.

          Related collections

          Most cited references31

          • Record: found
          • Abstract: found
          • Article: not found

          Simple technique for measurements of pulsed Gaussian-beam spot sizes.

          J. Liu (1982)
          A simple technique for in situ measurements of pulsed Gaussian-beam spot sizes is reported. This technique is particularly useful for measurements on highly focused beam spots. It can also be used for absolute calibration of the threshold-energy fluences for pulsed-laser-induced effects. The thresholds for several effects in picosecondlaser-induced phase transformation on silicon-crystal surfaces are calibrated with this technique.
            Bookmark
            • Record: found
            • Abstract: not found
            • Article: not found

            Ultrafast lasers—reliable tools for advanced materials processing

              Bookmark
              • Record: found
              • Abstract: not found
              • Article: not found

              Direct femtosecond laser surface nano/microstructuring and its applications

                Bookmark

                Author and article information

                Contributors
                (View ORCID Profile)
                (View ORCID Profile)
                Journal
                International Journal of Extreme Manufacturing
                Int. J. Extrem. Manuf.
                IOP Publishing
                2631-8644
                2631-7990
                January 20 2022
                March 01 2022
                January 20 2022
                March 01 2022
                : 4
                : 1
                : 015103
                Article
                10.1088/2631-7990/ac466e
                604b6a24-607d-4aca-ac72-e2aa480e65c8
                © 2022

                http://creativecommons.org/licenses/by/3.0

                History

                Comments

                Comment on this article