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      2012 IEEE International Conference on Microelectronic Test Structures (ICMTS)

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          Journal
          Title: IEEE Transactions on Electron Devices
          Abbreviated Title: IEEE Trans. Electron Devices
          Publisher: Institute of Electrical and Electronics Engineers (IEEE)
          ISSN (Print): 0018-9383
          ISSN (Electronic): 1557-9646
          Publication date Created: July 2011
          Publication date (Print): July 2011
          Volume: 58
          Issue: 7
          Page: 2183
          Article
          DOI: 10.1109/TED.2011.2159880
          SO-VID: 6afa05f5-083a-4af5-aea6-e073b3ec763a
          Copyright © © 2011
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