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      VLSI Yield Prediction and Estimation: A Unified Framework

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          Cost-size optima of monolithic integrated circuits

          B.T. Murphy (1964)
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            The simplicial approximation approach to design centering

            S. Director, G. Hachtel (1977)
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              Yield Model for Productivity Optimization of VLSI Memory Chips with Redundancy and Partially Good Product

              C. H. Stapper, A. McLaren, M. Dreckmann (1980)
              Article 0 comments Cited 32 times – based on 0 reviews     Review now
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                Author and article information

                Journal
                Title: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
                Abbreviated Title: IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.
                Publisher: Institute of Electrical and Electronics Engineers (IEEE)
                ISSN (Print): 0278-0070
                Publication date Created: January 1986
                Publication date (Print): January 1986
                Volume: 5
                Issue: 1
                Pages: 114-130
                Article
                DOI: 10.1109/TCAD.1986.1270182
                SO-VID: 6bfd2e1a-76e7-4820-af03-1357347dd8a7
                Copyright © © 1986
                History

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