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      Phase-Change Memory from Molecular Tellurides

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          Abstract

          Phase-change memory (PCM) is an emerging memory technology based on the resistance contrast between the crystalline and amorphous states of a material. Further development and realization of PCM as a mainstream memory technology rely on innovative materials and inexpensive fabrication methods. Here, we propose a generalizable and scalable solution-processing approach to synthesize phase-change telluride inks in order to meet demands for high-throughput material screening, increased energy efficiency, and advanced device architectures. Bulk tellurides, such as Sb 2Te 3, GeTe, Sc 2Te 3, and TiTe 2, are dissolved and purified to obtain inks of molecular metal telluride complexes. This allowed us to unlock a wide range of solution-processed ternary tellurides by the simple mixing of binary inks. We demonstrate accurate and quantitative composition control, including prototype materials (Ge–Sb–Te) and emerging rare-earth-metal telluride-doped materials (Sc–Sb–Te). Spin-coating and annealing convert ink formulations into high-quality, phase-pure telluride films with preferred orientation along the (00l) direction. Deposition engineering of liquid tellurides enables thickness-tunable films, infilling of nanoscale vias, and film preparation on flexible substrates. Finally, we demonstrate cyclable and non-volatile prototype memory devices, achieving performance indicators such as resistance contrast and low reset energy on par with state-of-the-art sputtered PCM layers.

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          Phase-change materials for non-volatile photonic applications

          Materials whose optical properties can be reconfigured are crucial for photonic applications such as optical memories. Phase-change materials offer such utility and here recent progress is reviewed.
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            Memory devices and applications for in-memory computing

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              Discovery of robust in-plane ferroelectricity in atomic-thick SnTe

              Stable ferroelectricity with high transition temperature in nanostructures is needed for miniaturizing ferroelectric devices. Here, we report the discovery of the stable in-plane spontaneous polarization in atomic-thick tin telluride (SnTe), down to a 1-unit cell (UC) limit. The ferroelectric transition temperature T(c) of 1-UC SnTe film is greatly enhanced from the bulk value of 98 kelvin and reaches as high as 270 kelvin. Moreover, 2- to 4-UC SnTe films show robust ferroelectricity at room temperature. The interplay between semiconducting properties and ferroelectricity in this two-dimensional material may enable a wide range of applications in nonvolatile high-density memories, nanosensors, and electronics.
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                Author and article information

                Journal
                ACS Nano
                ACS Nano
                nn
                ancac3
                ACS Nano
                American Chemical Society
                1936-0851
                1936-086X
                20 December 2023
                09 January 2024
                : 18
                : 1
                : 1063-1072
                Affiliations
                []Chemistry and Materials Design Group, Institute for Electronics, Department of Information Technology and Electrical Engineering, ETH Zurich , Gloriastrasse 35, CH-8092 Zurich, Switzerland
                []Integrated Systems Laboratory, Department of Information Technology and Electrical Engineering, ETH Zurich , Gloriastrasse 35, CH-8092 Zurich, Switzerland
                [§ ]Dipartimento di Chimica e Chimica Industriale, Università degli Studi di Genova , I-16146 Genova, Italy
                []Materials and Device Engineering Group, Institute for Electronics, Department of Information Technology and Electrical Engineering, ETH Zurich , Gloriastrasse 35, CH-8092 Zurich, Switzerland
                Author notes
                Author information
                https://orcid.org/0000-0002-3067-8571
                https://orcid.org/0000-0002-5252-635X
                https://orcid.org/0000-0002-5345-8694
                https://orcid.org/0000-0002-8843-5118
                https://orcid.org/0000-0001-6435-0227
                https://orcid.org/0000-0002-2006-2466
                Article
                10.1021/acsnano.3c10312
                10786157
                38117038
                76b89145-738c-4957-815d-cde729f744f3
                © 2023 The Authors. Published by American Chemical Society

                Permits the broadest form of re-use including for commercial purposes, provided that author attribution and integrity are maintained ( https://creativecommons.org/licenses/by/4.0/).

                History
                : 20 October 2023
                : 15 December 2023
                : 13 December 2023
                Funding
                Funded by: H2020 European Research Council, doi 10.13039/100010663;
                Award ID: 852751
                Funded by: Werner Siemens-Stiftung, doi 10.13039/100016964;
                Award ID: NA
                Categories
                Article
                Custom metadata
                nn3c10312
                nn3c10312

                Nanotechnology
                thin films,phase-change materials,tellurides,solution-based engineering,non-volatile memory devices

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