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      Looking Beyond 0 and 1: Principles and Technology of Multi‐Valued Logic Devices

      Author(s): 1 , 1 , 2 , 3 , 1 , 4
      Publication date (Electronic):
      Journal: Advanced Materials
      Publisher: Wiley

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          Tunneling in a finite superlattice

          R Tsu (1973)
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            Resonant tunneling in semiconductor double barriers

            L.-L. Chang, L. Esaki, R Tsu (1974)
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              Design of ion-implanted MOSFET's with very small physical dimensions

              R.H. Dennard, F.H. Gaensslen, V.L. Rideout … (1974)
              Article 0 comments Cited 444 times – based on 0 reviews     Review now
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                Author and article information

                Contributors
                Seunghwan Seo: (View ORCID Profile)
                Jin‐Hong Park: (View ORCID Profile)
                Journal
                Title: Advanced Materials
                Abbreviated Title: Advanced Materials
                Publisher: Wiley
                ISSN (Print): 0935-9648
                ISSN (Electronic): 1521-4095
                Publication date Created: December 2022
                Publication date (Electronic): November 17 2022
                Publication date (Print): December 2022
                Volume: 34
                Issue: 51
                Page: 2108830
                Affiliations
                [1 ]Department of Electrical and Computer Engineering Sungkyunkwan University Suwon 16419 Korea
                [2 ]Department of Semiconductor and Display Engineering Sungkyunkwan University Suwon 440‐746 Korea
                [3 ]Memory Technology Design Team Samsung Electronics Co. Ltd Hwasung 18448 Korea
                [4 ]SKKU Advanced Institute of Nanotechnology (SAINT) Sungkyunkwan University Suwon 16419 Korea
                Article
                DOI: 10.1002/adma.202108830
                SO-VID: 7ddcd87e-71fe-4214-9396-aa2d6034385c
                Copyright © © 2022
                License:

                http://onlinelibrary.wiley.com/termsAndConditions#vor

                http://doi.wiley.com/10.1002/tdm_license_1.1

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