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200 MeV silver ion irradiation induced structural modification in thin films at 89 K: An in situ x-ray diffraction study
R Biswal, J John, P. Mallick, B. C Dash, P. Kulriya, D. Avasthi, D Kanjilal, D Behera, T. Mohanty, P Raychaudhuri, N. Mishra, Narayan Mishra
2009
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