For Publishers
DiscoveryMetadataPeer reviewHostingPublishing
For Researchers
JoinPublishReviewCollect
Register
Blog
About
Search
Advanced search
My ScienceOpen
Search
For Publishers
For Researchers
Blog
About
12
views
9
references
 Top references
cited by
1
    
0 reviews
 Review
0
comments
 Comment
0
recommends
+1 Recommend
0 collections
    0
    shares
      1,744
      similar
       All similar
      • Record: found
      • Abstract: not found
      • Article: not found

      Technologies to improve photo-sensitivity and reduce VOD shutter voltage for CCD image sensors

      Read this article at

      ScienceOpenPublisher
      Bookmark
          There is no author summary for this article yet. Authors can add summaries to their articles on ScienceOpen to make them more accessible to a non-specialist audience.

          Related collections

          Most cited references9

          • Record: found
          • Abstract: not found
          • Conference Proceedings: not found

          No image lag photodiode structure in the interline CCD image sensor

          A. Kohono, Y Ishihara, E Oda … (1982)
          Article 0 comments Cited 19 times – based on 0 reviews
            Bookmark
            • Record: found
            • Abstract: not found
            • Article: not found

            Smear reduction in the interline CCD image sensor

            Y Ishihara, N. Teranishi (1987)
            Article 0 comments Cited 13 times – based on 0 reviews     Review now
              Bookmark
              • Record: found
              • Abstract: not found
              • Conference Proceedings: not found

              Interline CCD image sensor with an anti blooming structure

              E Takeuchi, T Kamata, M Nishimura … (1982)
              Article 0 comments Cited 12 times – based on 0 reviews
                Bookmark
                All references

                Author and article information

                Journal
                Title: IEEE Transactions on Electron Devices
                Abbreviated Title: IEEE Trans. Electron Devices
                Publisher: Institute of Electrical and Electronics Engineers (IEEE)
                ISSN (Print): 00189383
                Publication date (Print): Aug. 2000
                Volume: 47
                Issue: 8
                Pages: 1566-1572
                Article
                DOI: 10.1109/16.853032
                SO-VID: 99aeae5a-39a4-4e57-a18e-ea5a21762b8e
                Copyright © © 2000
                History

                Data availability:

                Comments

                Comment on this article